RFIC Test Engineering Manager 2
Company | Northrop Grumman |
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Location | Halethorpe, MD, USA |
Salary | $135800 – $203600 |
Type | Full-Time |
Degrees | Bachelor’s, Master’s, PhD |
Experience Level | Senior, Expert or higher |
Requirements
- Bachelor of Science degree in Electrical, Electronics or Computer Engineering, or related technical field with 8 years of related experience; Master’s Degree in Electrical, Electronics or Computer Engineering, or related technical field with 6 years of related experience; PhD. in Electrical, Electronics or Computer Engineering, or related technical field with 4 years of experience.
- Team management experience overseeing RF testing (microelectronics testing experience preferred).
- Good understanding of test software and hardware, operations and troubleshooting.
- Excellent verbal and written communication skills also required.
- Demonstrated understanding of process and product documentation requirements.
- An aptitude for technology development.
- U.S. Citizenship required.
- The ability to obtain and maintain a DoD Secret clearance is required.
Responsibilities
- Coordinating RFIC testing for wafers and packaged devices fabricated in SiGe BiCMOS technology and in various packaging form factors.
- Managing test engineers, test scheduling, equipment/software development and improvements, optimizing test accuracy and capability along with operational and throughput performance metrics.
- Interfacing with the foundry, design, and program teams to balance resources, meet objectives, resolve issues and develop team skills.
Preferred Qualifications
- Master’s of Science degree in Engineering, Engineering Leadership, or equivalent.
- Active Secret clearance.
- Management experience within a production environment is preferred.
- Semiconductor wafer level and packaged device testing experience.
- Comprehensive knowledge and experience in RF measurement techniques including hands on experience with VNA.
- Prior experience developing test software in C/C# or other programming languages.